Santa, Clara CA (PRWEB)
September 26, 2017
Covalent Metrology announced today that it has added two new metrology techniques to its product portfolio. The company now offers UV-Visible-Near Infrared (NIR) spectroscopy and spectral ellipsometry to complement its already successful atomic force microscopy (AFM) and white light interferometry services.
UV-Visible-NIR spectroscopy is used for reflectance and transmittance measurements across the ultra-violet, visible and near infrared spectra. The Shimadzu 3700 UV-Vis-NIR employed by Covalent covers the entire spectrum from deep UV (200nm) to near infrared (2600nm).
- Spectral ellipsometry measures properties such as thickness, refractive index, extinction coefficient of transparent films. Covalent offers ellipsometry using a J.A. Woollam VASE (variable angle spectroscopic ellipsometry), which is the gold standard in the field.
New Instruments, same focus on better data, faster and cheaper
Optical characterization and film thickness assessment are foundational elements of many advanced materials development programs. Bringing these techniques in-house positions Covalent to provide more comprehensive services to customers in optoelectronics (including advanced displays for virtual and augmented reality), solar, flexible electronics and smart-glass applications.
Ellipsometry and spectrophotometry are complex techniques that yield rich insights when combined with powerful modeling knowledge and experience. Covalent Metrology experts support the customer team in designing the best experiment and ensuring that high quality data is generated, properly modeled and analyzed.
This product expansion strengthens Covalent’s efforts to be the preferred fast-turnaround, easy-to-work-with partner for…